Crack and Pore Analysis

Automation Focused
Our goal is straightforward: to automate as much of your defect analysis as possible, through either fully automated or supervised workflows. MIPAR eliminates the need for manual point counting or annotation. Simply open an image, load your tailored recipe, and generate a report ready to share.
 
Material Overview
Defect analysis in metals is vital for assessing material quality and predicting material properties such as mechanical performance.
 
Challenges
Automating the analysis of metal defects, specifically cracks and pores, is challenging due to the need for high-resolution imaging to detect fine and subtle cracks and the variability in their morphology. Accurately identifying and measuring pores, which can vary in size, shape, and boundary clarity, adds another layer of complexity. The quality of the micrographs and the effects of sample preparation, such as polishing and etching, are crucial in determining the visibility and detectability of these defects. Advanced algorithms and computational techniques are essential for effectively distinguishing these defects from other microstructural features and accurately characterizing their properties.
 
MIPAR Solution
By combining robust Deep Learning models with conventional image analysis approaches, MIPAR quickly and accurately detects metal defects, even in the presence of complex textures. Once detected, defects can be automatically measured using size, shape, and orientation measurements, providing valuable insights into metal material properties.
 
Advantages
Save time, eliminate inter-operator variability, and gain a deeper understanding of your metal microstructure while gaining confidence in the quality of your measurements.
 
MIPAR Users
Ideal for metallurgists, materials scientists, research, and quality control professionals in the metal manufacturing industry.
 
Technical Details
MIPAR supports over 150 file types from a wide range of instrument types and manufacturers, including automated calibration and metadata import. Micrographs can be processed in batches, and MIPAR includes a batch review environment to ensure detection and measurement accuracy. To ensure data privacy and security, the software runs locally on your workstation, without the need for an internet connection.

System Requirements
Documentation >>

Demo
Have to see it to believe it? We understand, so we've made it easy to schedule a demo with a MIPAR Applications Engineer.

Support
Connect with our Applications Engineers, who bring years of experience in Materials Science and automated micrograph analysis. Our support team is dedicated to partnering with you in your scientific pursuits.

​Cost
​License costs vary depending on the type of license and the number of operators. Submit a quote request, and a representative will get back to you as soon as possible.

Resources
​​​•​ Citations
​​•​ Image Analysis and Defects
​•​ How to Measure Pore Size Distribution
​•​ ​Understanding the Importance of Pore Size Distribution Analysis

Check Out Our Products

MIPAR Base: our core product to analyze images from almost any source. Extensions enable Deep Learning models, Word reports and 3D data analysis.  MIPAR Base Page >>

​Microscope Software: capture, analyze and report all in a single workflow with MIPAR Live. Check to see if your camera is supported. MIPAR Live Page >> ​​

Compliance Software: analyze, report, and approve in a 21 CFR Part 11 or GMP Annex 11 compliant environment with traceability. MIPAR Checkpoint Page >> ​​

MIPAR APIs: tools to help integrate MIPAR detection and measurement solutions into other software applications and workflows. APIs Page >> ​​​

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