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Drone & Survey

Inspection
Remote Sensing
Manufacturing
Inventory

Contaminant Particles

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Filter paper contaminant classification and size measurement

Detected contaminants are classified into predefined types and the size and shape reported.

Integrated Circuit

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Detection of defects in silicon integrated circuit wafer
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Imaged defects automatically recognized and counted. Defects in processing are revealed by areas of photoresist which were not fully developed.

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  • Products
    • Analysis Software
    • Microscope Software
    • APIs
    • Request a Quote
  • Applications
    • Materials Science
    • Life Science
    • Drone & Survey
    • Recipe Templates
    • Articles & Citations
    • Webinars
  • Deep Learning
  • User Resources
    • Udemy Course
    • Help desk
    • Forum
    • Tutorials
    • FAQ
    • User Manual
  • About
  • Download Trial