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Drone & Survey

Inspection
Remote Sensing
Manufacturing
Inventory
  • Contaminant Particles

  • Integrated Circuit

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    Filter paper contaminant classification and size measurement

    Detected contaminants are classified into predefined types and the size and shape reported.

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    Detection of defects in silicon integrated circuit wafer
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    Imaged defects automatically recognized and counted. Defects in processing are revealed by areas of photoresist which were not fully developed.

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    Ductile iron micrograph phase analysis, separated into graphite, ferrite and pearlite

    Fully automated solution, analyze micrographs off of the microscope or run sample data sets in batch. 
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    Ductile iron micrograph phase analysis, separated into nodular graphite, non-nodular graphite (ASTM A247) and ferrite

    Fully automated solution, analyze micrographs off of the microscope or run sample data sets in batch. 
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  • About
  • Applications
    • Materials Science
    • Life Science
    • Drone & Survey
    • Recipe Templates
    • Integrations >
      • MIPAR Live
      • Python API
      • REST API
      • Granta MI
    • Webinars
    • Articles & Citations
  • Deep Learning
  • Purchase
    • Request a Quote
    • Find a Distributor
    • Student Store
  • User Resources
    • Udemy Course
    • Help desk
    • Forum
    • Tutorials
    • FAQ
    • User Manual
  • Download Trial