Drone & Survey

Inspection

Remote Sensing

Manufacturing

Inventory

• Contaminant Particles

• Integrated Circuit

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  Filter paper contaminant classification and size measurement
  
  Detected contaminants are classified into predefined types and the size and shape reported.

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  Detection of defects in silicon integrated circuit wafer
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  Imaged defects automatically recognized and counted. Defects in processing are revealed by areas of photoresist which were not fully developed.

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  Ductile iron micrograph phase analysis, separated into graphite, ferrite and pearlite
  
  Fully automated solution, analyze micrographs off of the microscope or run sample data sets in batch. ​​

  Ductile iron micrograph phase analysis, separated into nodular graphite, non-nodular graphite (ASTM A247) and ferrite
  
  Fully automated solution, analyze micrographs off of the microscope or run sample data sets in batch. ​​​

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